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Inorganic Materials, Volume 42, Number 8 (2006), 924-931, DOI: 10.1134/
S0020168506080231
High-resolution Fourier-transform IR spectroscopic determination of
impurities in silicon tetrafluoride and silane prepared from it
L. A. Chuprov, P. G. Sennikov, K. G. Tokhadze, S. K. Ignato... 阅读全帖 |
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