Title: Mott-Schottky analysis of thin ZnO films
Author(s): Windisch CF; Exarhos GJ
Conference: 46th National Symposium of the American-Vacuum-Society Location:
SEATTLE, WASHINGTON Date: OCT 25-29, 1999
Sponsor(s): Amer Vacuum Soc
Source: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
Volume: 18 Issue: 4 Pages: 1677-1680 DOI: 10.1116/1.582406 Part:
Part 2 Published: JUL-AUG 2000
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