l**********w
发帖数: 336 | 1 Journal of Microscopy, 2014 Sep;255(3):180-7.
Use of permanent marker to deposit a protection layer against FIB damage in
TEM specimen preparation
Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang
DOI: 10.1111/jmi.12150
e-mail: [email protected] | l**********w
发帖数: 336 | 2 文章已经求到，再次感谢那位热心朋友。
in
【在 l**********w 的大作中提到】
: Journal of Microscopy, 2014 Sep;255(3):180-7.
: Use of permanent marker to deposit a protection layer against FIB damage in
: TEM specimen preparation
: Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang
: DOI: 10.1111/jmi.12150
: e-mail: [email protected]
| l**********w
发帖数: 336 | 3 Journal of Microscopy, 2014 Sep;255(3):180-7.
Use of permanent marker to deposit a protection layer against FIB damage in
TEM specimen preparation
Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang
DOI: 10.1111/jmi.12150
e-mail: [email protected] | l**********w
发帖数: 336 | 4 文章已经求到，再次感谢那位热心朋友。
in
【在 l**********w 的大作中提到】
: Journal of Microscopy, 2014 Sep;255(3):180-7.
: Use of permanent marker to deposit a protection layer against FIB damage in
: TEM specimen preparation
: Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang
: DOI: 10.1111/jmi.12150
: e-mail: [email protected]
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