d*****s
发帖数: 313 | 1 I am very new to polymer and basically blind of all the primary
measuring techniques. So my question may be too simple. hehe
I use spin-coater to get a polymer film. Then how can I measure the
thickness of this film? Laser? What if the film is not transparent to
normal laser wavelength? |
w********h
发帖数: 12367 | 2 Generally they use ellipsometry to measure thin film.
【在 d*****s 的大作中提到】
: I am very new to polymer and basically blind of all the primary
: measuring techniques. So my question may be too simple. hehe
: I use spin-coater to get a polymer film. Then how can I measure the
: thickness of this film? Laser? What if the film is not transparent to
: normal laser wavelength?
|
d*****s
发帖数: 313 | 3 what is it?
【在 w********h 的大作中提到】
: Generally they use ellipsometry to measure thin film.
|
c*s
发帖数: 2145 | 4 gengerally using eliposometry to measure thickness. But this method is bit
complicated... there is another technique using quatz vibration( i forget the
name of it)
you can also use SEM to characterize your film from side view, if your film is
thicker than tens of nms.
【在 d*****s 的大作中提到】
: I am very new to polymer and basically blind of all the primary
: measuring techniques. So my question may be too simple. hehe
: I use spin-coater to get a polymer film. Then how can I measure the
: thickness of this film? Laser? What if the film is not transparent to
: normal laser wavelength?
|
c*s
发帖数: 2145 | 5 it uses the different refractive index between substrate and your film...
more details, i dunt know.
But it requires that you know the approximate thickness beforehand, then it
will try-and-error and give you the value...
【在 d*****s 的大作中提到】
: what is it?
|
d*****s
发帖数: 313 | 6 thanks! I will look into it!
【在 c*s 的大作中提到】
: it uses the different refractive index between substrate and your film...
: more details, i dunt know.
: But it requires that you know the approximate thickness beforehand, then it
: will try-and-error and give you the value...
|
b**s
发帖数: 589 | 7 我以前上班的时候看人家用过X射线测厚，好象还有gamma测厚，不知可用否？
为什么不先测重量，在换算成体积，再除以面积，不就是厚度了？
the
is
【在 c*s 的大作中提到】
: gengerally using eliposometry to measure thickness. But this method is bit
: complicated... there is another technique using quatz vibration( i forget the
: name of it)
: you can also use SEM to characterize your film from side view, if your film is
: thicker than tens of nms.
|
w********h
发帖数: 12367 | 8 Dr.Composto in Materials Science Department at your university has it,
go there and use it....
it
【在 d*****s 的大作中提到】
: thanks! I will look into it!
|
d*****s
发帖数: 313 | 9 I need to use his spin coater anyway. hehe
【在 w********h 的大作中提到】
: Dr.Composto in Materials Science Department at your university has it,
: go there and use it....
:
: it
|
w********h
发帖数: 12367 | 10 His group will collaborate with us in one subject...
I need to use their FRES.
【在 d*****s 的大作中提到】
: I need to use his spin coater anyway. hehe
|
d*****s
发帖数: 313 | 11 really? Come to philly, find me and I treat you. hehe
【在 w********h 的大作中提到】
: His group will collaborate with us in one subject...
: I need to use their FRES.
|
c********n
发帖数: 7 | 12 There are several ways to measure the thickness.
Mass method only works for thickness larger than microns.
Ellispometry is the most popular method measure from 1 micron
down to few nonometers as in the case of SAMs. You have to know
some prior info for this technique, like optical constant
of substrate and film (wavelength dependent), which sometimes
is not easy to get. Some widely-accepted assumptions include:
1) for most thin organic film, n~1.45.
2) for thick polymer film, optical constant is
【在 b**s 的大作中提到】
: 我以前上班的时候看人家用过X射线测厚，好象还有gamma测厚，不知可用否？
: 为什么不先测重量，在换算成体积，再除以面积，不就是厚度了？
:
: the
: is
|
d*****s
发帖数: 313 | 13 But in case of growing polymers on plastics, both ellipsometry and x-ray
wont work. Plastics is kind of headache to handle. It has rough surfaces, so
it does some good things like making it easy for polymer to grow on it,
however, there is no standard way to measure lots of properties of the
polymer on plastics...
【在 c********n 的大作中提到】
: There are several ways to measure the thickness.
: Mass method only works for thickness larger than microns.
: Ellispometry is the most popular method measure from 1 micron
: down to few nonometers as in the case of SAMs. You have to know
: some prior info for this technique, like optical constant
: of substrate and film (wavelength dependent), which sometimes
: is not easy to get. Some widely-accepted assumptions include:
: 1) for most thin organic film, n~1.45.
: 2) for thick polymer film, optical constant is
|
