d********y
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Inorganic Materials, Volume 42, Number 8 (2006), 924-931, DOI: 10.1134/
S0020168506080231
High-resolution Fourier-transform IR spectroscopic determination of
impurities in silicon tetrafluoride and silane prepared from it
L. A. Chuprov, P. G. Sennikov, K. G. Tokhadze, S. K. Ignatov and O. Schrems | m*******7
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【在 d********y 的大作中提到】
: Many thanks in advance! Please send pdf to x*********[email protected]
: https://springerlink3.metapress.com/content/f585364t7483p74x/resource-
: secured/?target=fulltext.pdf&sid=oen5lmhnz50jsqzpjrpo2bow&sh=www.
: springerlink.com
: Inorganic Materials, Volume 42, Number 8 (2006), 924-931, DOI: 10.1134/
: S0020168506080231
: High-resolution Fourier-transform IR spectroscopic determination of
: impurities in silicon tetrafluoride and silane prepared from it
: L. A. Chuprov, P. G. Sennikov, K. G. Tokhadze, S. K. Ignatov and O. Schrems
| d********y
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【在 m*******7 的大作中提到】
: check your email.
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